A BIST (built-in self-test) strategy for mixed-signal integrated circuits [Elektronische Ressource] / vorgelegt von Hongzhi, Li

Lihongzh

Informations

• Publié par: friedrich-alexander-universitat_erlangen-nurnberg
• Publié le: 01 janvier 2004
• Nombre de lectures: 9
• Langue: English
• Poids de l'ouvrage: 1 Mo

Extrait

A BIST (BUILT-IN SELF-TEST) STRATEGY FOR
MIXED-SIGNAL INTEGRATED CIRCUITS





Der Technischen Fakult t der
Universit t Erlangen-N?rnberg

zur Erlangung des akademischen Grades
DOKTOR-INGENIEUR




Vorgelegt von
Hongzhi, Li



Erlangen - 2004




















Als Dissertation genehmigt von
der Technischen Fakult t der
Universit t Erlangen-Nrnberg ?



Tag der Einreichung: 19.04.2004
Tag der Promotion: 29.10.2004

Dekan: Prof. rer. nat. Albrecht Winnacker
Berichterstatter: Prof. Dr. -Ing. Dr. -Ing. habil. Robert Weigel
Prof. Dr. -Ing. Richard Hagelauer
II Acknowledgments


I would like to take this opportunity to thank those who have made the recent three
years of my life a memorable and unforgettable experience.

First of all, I would like to thank my supervisor Prof. Dr. Robert Weigel of the Univer-
sity of Erlangen-N rnberg, Germany. Thanks for the support, for the intelligent guid-
ance, for the valuable comments when I need them most. Above of all, for the trust
demonstrated in giving me the opportunity to pursue this interesting experience. A few
words cannot express the extent to which I am indebted to the positive influence from
him.

Then, I would like to thank Prof. Dr. Andreas Springer of the University of Linz, Aus-
tria, who was my supervisor of my master thesis in 2000 and gives me much support
even from a distance during my Ph. D. research. Thanks for all he has done for me.

I would like to thank Prof. Dr. Elmar Schr fer of the Technical University of Munich
for his helpful supporting during my stay in Munich, Germany.

During my stay at Infineon Technologies AG, I enjoyed technical interactions with a
large number of brilliant people. I would like to extend my gratitude to Dr. Josef Eck-
m?ller, Dr. Sebastian Sattler and Dr. Heinz Mattes, who take time off their busy
schedules and supervised my work. I would like to thank Dr. Herbert Eichfeld for his
continuous supporting during my stay at Infineon Technologies AG. My thanks also
go to: Mr. Stefan Buch, Mr. Holger Gryska, Mr. Steffen Meier, Dr. Victor Dias and
Mr. Ralf Schledz for their helpful advice.

The members of the SMS DMT group of Infineon Technologies AG deserve special
mention: Dr. Sylvio Triebel, Dr. Thomas Piorek, Mr. Thomas Wilde, Mr. Markus
Tristl, Mr. Xianghua Shen. They all had a great deal of influence on my work and
technical ability. In addition to being good colleagues, they have been great friends,
during good and bad time.

A special appreciation is given to my parents and my younger brother, who are now in
China and give me unconditional support in my long academic way. This dissertation
is dedicated to my family.

Munich, 2004
III
Abstract


BIST (Built-in Self-Test) Strategy for Mixed-Signal Integrated Circuits

Recently, more and more system functionalities have been integrated onto a single
chip, because the electronic systems become more complex and the very deep sub-
micron technologies make such an integration possible as well. Consequently, mixed-
signal ICs (Integrated Circuits) which combine both digital and analog parts on the
same substrate are widely employed. But the high density, limited I/O pins, and espe-
cially, the analog nature of such ICs make their testing both difficult and expensive. In
all the proposed test methods, DFT (Design for Test) and BIST (Built-In Self-Test)
techniques have been proven to be very effective by the meaning of increasing the ob-
servability and controllability of the CUT (Circuit under Test).

This work presents DFT and BIST techniques for the production testing of mixed-
signal circuits. The special test strategies for the typical mixed-signal components
ADC (Analog-to-Digital Converter) and DAC (Digital-to-Analog Converter) imple-
mented on one chip are discussed. The traditional test for such mixed-signal compo-
nents can be completed through a DSP-based mixed-signal tester with an arbitrary wa-
veform generator and a signal digitizer. But such a test is very costly and time-
consuming. Hence a BIST strategy based on a loop structure is proposed in this work
for testing ADC/DAC pairs. This BIST method is called Loop-BIST and takes the ad-
vantage of the presence of the ADC and the DAC on the same chip: the analog parts of
the ADC to be tested and the DAC to be tested are connected together to form a fully
digital loop so that the loop test is a digital driven one. In such a way, the test can be
moved from the mixed-signal domain to the digital domain which is much easier and
more cost-effective. According to the different resolution of the ADC or the DAC, the
loop and the sequence of the testing steps should be different as well. All these issues
are discussed in this work along with some industrial application cases.

This BIST method realizes the test control, test stimulus generation and test response
evaluation at the aspect of the on-chip circuitry. Various methods for generating a test
stimulus and for evaluating a test response are discussed in this work. These methods
can be also employed for other BIST applications. In this work, a new digital scheme
based on filtering a periodical signal finds its application in the generation of a digital
stimulus. Meanwhile the DELTA-SIGMA modulation technique is used as a genera-
tion method for an analog stimulus. The dynamic parameters can be extracted through
IV a notch filter, without needing the presence of an on-chip DSP. This makes the pro-
posed BIST approach more common. Moreover, a new DAC BIST method is given,
which is based on the one-point-multi-level algorithm. In designing and implementing
the BIST scheme, a particular filter type a WDF (Wave Digital Filter) is involved.
This class of filter has been known for several years. Its economic realization and low
coefficient sensitivity have made it a design technique exploited in many low-power,
up-to-date applications. The demonstration of the proposed Loop-BIST is given
through various simulation results in the last parts of this work.
V Zusammenfassung


BIST (Built-in Self-Test) Strategie f r integrierte Mixed-Signal Schaltungen

Die steigende Komplexit t elektronischer Systeme f hrt heute dazu, mehr und mehr
Systemfunktionalit ten auf einem einzigen Chip integrieren zu wollen. Neue Techno-
logien, wie die sogenannten Deep-Submicron-Technologien, machen es m glich sol-
che ehrgeizigen Ziele auch in die Realit t umsetzen zu k nnen und die gemeinsame In-
tegration von digitalen und analogen Schaltungen auf dem gleichen Substrat voranzu-
treiben. Die entstehenden hohen Integrationsdichten, die damit verbundenen begrenz-
ten M glichkeiten der Zug nge zu inneren Schaltungsknoten und insbesondere das a-
naloge Verhalten solcher gemischter integrierter Schaltungen machen die abschlie en-
de Qualit ts berpr fung, den Vorgang des Testens, sehr schwierig und teuer. Akzep-
tierte Methoden, welche den Test oder die den Test unterst tzenden Ma nahmen be-
reits im Design ber cksichtigen bzw. implementieren (DFT: Design For Test) oder
welche sogar sich selber testende Schaltungen ins Design einbetten (BIST: Built-In
Self-Test), haben schon ihre Effektivit t im Hinblick auf erweiterte Beobachtbarkeit
und Steuerbarkeit der zu testenden Schaltungen gezeigt.

Die vorliegende Arbeit untersucht DFT- und BIST-Techniken f?r den Produktionstest
von gemischten analogen und digitalen integrierten Schaltungen (Mixed-Signal-
Schaltungen). Es werden verschiedene Teststrategien f?r typische Mixed-Signal-
Anwendungen diskutiert, die sowohl einen Analog-Digital-Converter (ADC) als auch
einen Digital-Analog-Converter (DAC) auf einem Chip integrieren. Der traditionelle
Testflow fr solche? Mixed-Signal-Komponenten wird auf ein DSP-basiertes Mixed-
signal-Testsystem zur?ckgef hrt, das einen allgemeinen Signalgenerator (Wave Form
Generator) und einen Digitalisierer (Signal Digitizer) verwendet. Der Nachteil solcher
automatisierter allgemein verwendbarer Testsysteme liegt jedoch in ihrem hohen Zeit-
und Kostenaufwand. Daher wird in dieser Arbeit fr Tests, die? auf das P rchen ADC
und DAC zur ckgreifen k nnen, eine Teststrategie vorgeschlagen, welche auf einer
r ckgef hrten Schleifenstruktur basiert. Diese BIST-Methode ist in der Literatur als
Loop-Back BIST bekannt und hat den Vorteil, dass ADC und DAC, die ja beide auf
einem Chip vorhanden sind, fr den? Test verwendet werden k nnen. Die zu testenden
analogen Teile von ADC und DAC werden so kombiniert, dass eine rein digitale
Schaltung entsteht, um dann einen digital getriebenen Schaltungstest durchf hren zu
k nnen. Der Mixed-Signal-Test wird so zum Digital-Test umgewandelt, was fr viele?
Anwendungen einfacher und kosteng nstiger ist. Je nachdem, ob die Aufl sung von
ADC oder DAC unterschiedlich ist, wird die Schaltung und dementsprechend die Rei-
VI henfolge der Tests ge ndert. Alle oben genannten Methoden werden in dieser Arbeit
an Hand von Beispie