A tutorial on built-in self-test. I. Principles - IEEE Design & Test of Computers

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Description

A Tubrial on BuiIHn SeFTest Part 1: Principles DURING ITS LIFETIME, a digital In the several years since this VlSHWANl D. AGRAWAL is tested and diagnosed on system magazine's publication of a pair of AT&T Bell Laboratories numerous occasions. For the sys- tutorial articles on BIST,*z2 both tem to perform its intended mission BIST research and its application CHARLES R. KlME with high availability, testing and di- have grown rapidly. Although our KWAL K. SALUJA agnosis must be quick and effec- original goal was to write a detailed tive. Asensible way to ensure this is tutorial, we found that adequate Universiiy of Wisconsin, to specify test as one of the system covemge of the myriad of techniques functions-in other words, self-test. available was not feasible within our Digital systems involve a hierarchy space limitations. Hence, on some of parts: chips, boards, cabinets, of BIST we present limited aspects so on. At the highest level, and detail, supported by pointers to the which may include the entire sys- literature. Aiso, to limit the number tem, the operation is controlled by of sources the interested reader software. Self-test is often imple needs to consult, we often refer to mented in software. While a purely books rather than original papers. software approach to self-test may In no way do we intend to diminish suffice at thesystem level, it hassev- the contributions of the original re era1 disadvantages. Such testing searchers or ...

Informations

• Publié par: Iddu
• Nombre de lectures: 27
• Langue: English

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