On the adhesion between fine particles and nanocontacts [Elektronische Ressource] : an atomic force microscope study / vorgelegt von Mahdi Farshchi Tabrizi
121 pages
English

On the adhesion between fine particles and nanocontacts [Elektronische Ressource] : an atomic force microscope study / vorgelegt von Mahdi Farshchi Tabrizi

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On the adhesion between fine particles and nanocontacts: an atomic force microscope study DISSERTATION zur Erlangung des Grades eines Doktors der Naturwissenschaften vorgelegt von Dipl.- phys. Mahdi Farshchi Tabrizi aus der IR.Iran eingereicht beim Fachbereich 8 der Universität Siegen Siegen 2007 1. Gutachter: Prof. Dr. H.-J. Butt 2. Gutachter: Prof. Dr. A. Mews 3. Gutachter: Prof. Dr. H.-J. Deiseroth Datum der mündlichen Prüfung: 23. 1. 2007 To all due to whom I arrived to this point Abstract To optimize the handling of fine powders in industrial applications, understanding the interaction forces between single powder particles is fundamental. The forces between colloidal particles dominate the behavior of a great variety of materials, including paints, paper, soil, and many industrial processes. With the invention of the atomic force microscope (AFM), the direct measurement of the interaction between single micron-sized particles became possible. The adhesional contact between a particle and a substrate is a parameter for analyzing pull-off force data generated by AFM. The aim of this study was to understand surface interactions between fine particles. I measured the adhesion forces between AFM tips or particles attached to AFM cantilevers and different solid samples.

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Publié par
Publié le 01 janvier 2007
Nombre de lectures 74
Langue English
Poids de l'ouvrage 2 Mo