TWO-SCALE ANALYSIS FOR VERY ROUGH THIN LAYERS. AN EXPLICIT CHARACTERIZATION OF THE POLARIZATION TENSOR IONEL SORIN CIUPERCA, RONAN PERRUSSEL, AND CLAIR POIGNARD Abstract. We study the behaviour of the steady-state voltage potential in a material composed of a two-dimensional object surrounded by a very rough thin layer and embedded in an ambient medium. The roughness of the layer is described by a quasi ?–periodic function, ? being a small parameter, while the mean thickness of the layer is of magnitude ?? , where ? ? (0, 1). Using the two-scale analysis, we replace the very rough thin layer by appropriate trans- mission conditions on the boundary of the object, which lead to an explicit characterization of the polarization tensor as defined in Vogelius and Capde- boscq (ESAIM:M2AN. 2003; 37:159-173). This paper extends the previous works of Poignard (Math. Meth. App. Sci. 2009; 32:435-453) and of Ciuperca et al. (Research report INRIA RR-6812), in which ? ≥ 1. 1. Introduction Consider a material composed of a two-dimensional object surrounded by a very rough thin layer. We study the asymptotic behaviour of the steady-state voltage potential when the thickness of the layer tends to zero. We present approximate transmission conditions to take into account the effects due to the layer without fully modeling it.
- thin layers
- solutions u?
- ?t ?
- scale analysis
- main results
- function ?
- constant thickness
- positive constant
- ?? ∫